Scanning Electron Microscope
MODEL # OF EQUIPMENT: JEOL SM-6010PLUS/LA | |
BRIEF DESCRIPTION OF EQUIPMENT: The Russ College provides the JEOL JSM-6010PLUS/LA, which is available for use by interested researchers at 91探花 for characterization of metallic, ceramic, polymeric and composite materials. This instrument includes a microscope for geometric and morphological characterization of conductive and non-conductive samples as well as a spectroscope for elemental analyses and distribution. This instrument is complemented by the Denton Vacuum Desk V for pre-treatment of non-conductive samples prior to characterization. | |
CAPABILITIES OF THE EQUIPMENT:
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TRAINING/TECHNICAL HELP AVAILABLE OR REQUIRED TO USE EQUIPMENT? Yes | |
FEES FOR USE OF EQUIPMENT? Yes, $55
Revised 04/25/23 |